IBA

A suite of particle accelerator-based techniques is available for material characterization of composition and impurities over an extended range in Z. The techniques can also be applied to material comprised of a single crystal to determine the lattice location of defects and impurities within the crystal. The list of techniques includes Rutherford backscattering spectrometry (RBS), nuclear reaction analysis (NRA), elastic recoil detection analysis (ERDA) and particle-induced X-ray emission (PIXE) for compositional analysis; and ion channeling for determining the lattice location of structural and compositional defects in single crystals. The techniques are provided using either a broad beam (diameter of ~1 mm) or a focused beam (dia. ~ 1 µm). The focused ion beam can be raster-scanned to provide lateral maps of defects or impurities. Note: The focus ion beam will not be available until July of 2011.

Instruments: 2.5 MV Van de Graaff accelerator with NEC RC 43 end station (available in Fall 2011) and nuclear microprobe (available in Summer 2011)

CURRENT NEWS

• ARI named "Venture of the Year": Oct 11
• ARI and ADA National SBIR Conference: Sep 11
• ARI hosts Chamber Business After hours: Jun 11
• 2-year funding approved from OCAST: May 11
• Recruiting senior-related companies: Apr 11
• In-depth look at human resources: Mar 11
• Rob Kuester awarded 5-year service award: Mar 11