Fourier-transform infrared spectroscopy (FTIR)

Sub-band transitions and band bending, and associated changes in the electrical properties of semiconductors can be characterized by the absorption IR spectroscopy.  A beam of IR is transmitted through the sample (or reflected off the sample) and the resonant inter-atomic bond energies are absorbed, which are detected by interferometer. Absorbed energies are the signature of chemical bond preset in the sample.
ARI is equiped with a Nicolet 6700 Analytical FTIR with following specification:

• 0.1 cm-1 resolution
• Integrated Scan Buttons
• Gold optics
• DLaTGS Detector (detection range 400 to 4000 cm-1 wave number)
• Ge on KBr beam splitter
• Talon interchangeable beam splitter system
• Sealed and Desiccated to avoid humid background
• Ge-ATR crystal for lower depth of penetration and IR non-transparent materials analysis in attenuated total reflection mode. In attenuated total reflection (ART) mode much tighter spot size (< 250 mm) and depth of penetration can be maintained for thin film characterization.

CURRENT NEWS

• ARI named "Venture of the Year": Oct 11
• ARI and ADA National SBIR Conference: Sep 11
• ARI hosts Chamber Business After hours: Jun 11
• 2-year funding approved from OCAST: May 11
• Recruiting senior-related companies: Apr 11
• In-depth look at human resources: Mar 11
• Rob Kuester awarded 5-year service award: Mar 11